Lithographic apparatus and device manufacturing method

A uniformity controller is arranged to control a profile of a radiation intensity along the length of a target portion of a substrate so as to substantially compensate for irradiation-induced variation of the profile with respect to time. The uniformity controller includes a variable filter interpos...

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Bibliographische Detailangaben
1. Verfasser: BOUMAN WILLEM JAN
Format: Patent
Sprache:eng
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