System and method for measuring surface appearance of a surface
The embodiments described herein include a system and method for measuring a surface appearance of a surface. An appearance sensor is positionable about a surface and is configured to measure the surface appearance. A surface relationship sensor senses the distance between the appearance sensor and...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | MIGDA FRANCIS M PURCELL JOHN BRASLAW JACOB |
| description | The embodiments described herein include a system and method for measuring a surface appearance of a surface. An appearance sensor is positionable about a surface and is configured to measure the surface appearance. A surface relationship sensor senses the distance between the appearance sensor and the surface. The appearance sensor is then positioned about the surface based on the sensed distance. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7499811B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7499811B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7499811B23</originalsourceid><addsrcrecordid>eNrjZLAPriwuSc1VSMxLUchNLcnIT1FIyy8CMhOLS4sy89IVgFRaYnKqQmJBQWpiUWIekJmfppAIE-dhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBUAleakl8aHB5iaWlhaGhk5GxkQoAQAijzCJ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System and method for measuring surface appearance of a surface</title><source>esp@cenet</source><creator>MIGDA FRANCIS M ; PURCELL JOHN ; BRASLAW JACOB</creator><creatorcontrib>MIGDA FRANCIS M ; PURCELL JOHN ; BRASLAW JACOB</creatorcontrib><description>The embodiments described herein include a system and method for measuring a surface appearance of a surface. An appearance sensor is positionable about a surface and is configured to measure the surface appearance. A surface relationship sensor senses the distance between the appearance sensor and the surface. The appearance sensor is then positioned about the surface based on the sensed distance.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20090303&DB=EPODOC&CC=US&NR=7499811B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20090303&DB=EPODOC&CC=US&NR=7499811B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MIGDA FRANCIS M</creatorcontrib><creatorcontrib>PURCELL JOHN</creatorcontrib><creatorcontrib>BRASLAW JACOB</creatorcontrib><title>System and method for measuring surface appearance of a surface</title><description>The embodiments described herein include a system and method for measuring a surface appearance of a surface. An appearance sensor is positionable about a surface and is configured to measure the surface appearance. A surface relationship sensor senses the distance between the appearance sensor and the surface. The appearance sensor is then positioned about the surface based on the sensed distance.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAPriwuSc1VSMxLUchNLcnIT1FIyy8CMhOLS4sy89IVgFRaYnKqQmJBQWpiUWIekJmfppAIE-dhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBUAleakl8aHB5iaWlhaGhk5GxkQoAQAijzCJ</recordid><startdate>20090303</startdate><enddate>20090303</enddate><creator>MIGDA FRANCIS M</creator><creator>PURCELL JOHN</creator><creator>BRASLAW JACOB</creator><scope>EVB</scope></search><sort><creationdate>20090303</creationdate><title>System and method for measuring surface appearance of a surface</title><author>MIGDA FRANCIS M ; PURCELL JOHN ; BRASLAW JACOB</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7499811B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MIGDA FRANCIS M</creatorcontrib><creatorcontrib>PURCELL JOHN</creatorcontrib><creatorcontrib>BRASLAW JACOB</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MIGDA FRANCIS M</au><au>PURCELL JOHN</au><au>BRASLAW JACOB</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and method for measuring surface appearance of a surface</title><date>2009-03-03</date><risdate>2009</risdate><abstract>The embodiments described herein include a system and method for measuring a surface appearance of a surface. An appearance sensor is positionable about a surface and is configured to measure the surface appearance. A surface relationship sensor senses the distance between the appearance sensor and the surface. The appearance sensor is then positioned about the surface based on the sensed distance.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US7499811B2 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | System and method for measuring surface appearance of a surface |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-30T05%3A56%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MIGDA%20FRANCIS%20M&rft.date=2009-03-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7499811B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |