System and method to pattern an object through control of a radiation source

A radiation source for use in lithography. The radiation source comprising a pn-junction disposed on a substrate that can be reverse-biased to cause avalanche breakdown and emission of UV or DUV radiation by deceleration of electrons accelerated into an n-type region of the pn-junction. The radiatio...

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1. Verfasser: SINKE ARNOLD
Format: Patent
Sprache:eng
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