Method and system for measuring laser induced phenomena changes in a semiconductor device

A method and system for measuring laser induced phenomena changes of at least one of a resistance, a capacitance and an inductance in a semiconductor device. The method comprises interconnecting an electrical bridge circuit across the semiconductor device, the semiconductor device being connected as...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TAN SOON HUAT, NG HOO YIN, KOH LIAN SER, CHUA CHOON MENG, PHANG JACOB CHEE HONG
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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