Generation of a testbench for a representation of a device

A system and method for generating a testbench for a representation of a device to be incorporated in a data processing apparatus is provided. The representation of the device is configurable based on configuration data specifying predetermined attributes of one or more components of the data proces...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	HOULIHANE THOMAS SEAN
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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