Filling narrow and high aspect ratio openings using electroless deposition

Methods of fabricating an interconnect utilizing an electroless deposition technique, which fundamentally consists of providing a dielectric material layer having an opening extending into the dielectric material from a first surface thereof, and electrolessly depositing a conductive material within...

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Bibliographische Detailangaben
Hauptverfasser: TSANG CHI-HWA, CHOWDHURY SHAESTAGIR
Format: Patent
Sprache:eng
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