Method and apparatus for broadcasting test patterns in a scan based integrated circuit

A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The br...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG LAUNG-TERNG (L.-T.), SHEU BORYAU (JACK), JIANG ZHIGANG, WANG ZHIGANG, WU SHIANLING
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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