In-situ large area optical strain measurement using an encoded dot pattern

In-situ large area optical strain measurement using an encoded dot pattern

A method of measuring strain in a test specimen comprises the steps of placing a pattern of marks on a surface of the test specimen, wherein the pattern of marks includes a plurality of target marks and a plurality of sets of coded marks, using the sets of coded marks to identify locations of at lea...

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Hauptverfasser: NARDIELLO JERRELL ANTHONY, MADSEN JOHN STEVEN, CHRIST, JR. ROBERT J, PAPAZIAN JOHN M
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator NARDIELLO JERRELL ANTHONY
MADSEN JOHN STEVEN
CHRIST, JR. ROBERT J
PAPAZIAN JOHN M
description A method of measuring strain in a test specimen comprises the steps of placing a pattern of marks on a surface of the test specimen, wherein the pattern of marks includes a plurality of target marks and a plurality of sets of coded marks, using the sets of coded marks to identify locations of at least two of the target marks, and using a change in distance between at least two of the marks to determine strain in the test specimen. An apparatus that performs the method is also provided.
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title In-situ large area optical strain measurement using an encoded dot pattern
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