Apparatus, system and method for testing electronic elements

Apparatus, system and method for testing electronic elements

An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region config...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: WU SHYAN-I, LIN YI-LI, LI KUANG-JUNG, HSU CHINN
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator WU SHYAN-I
LIN YI-LI
LI KUANG-JUNG
HSU CHINN
description An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7374293B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7374293B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7374293B23</originalsourceid><addsrcrecordid>eNrjZLBxLChILEosKS3WUSiuLC5JzVVIzEtRyE0tychPUUjLL1IoSS0uycxLV0jNSU0uKcrPy0wGMXNT80qKeRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwubG5iZGlsZORMRFKAKSGL9s</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Apparatus, system and method for testing electronic elements</title><source>esp@cenet</source><creator>WU SHYAN-I ; LIN YI-LI ; LI KUANG-JUNG ; HSU CHINN</creator><creatorcontrib>WU SHYAN-I ; LIN YI-LI ; LI KUANG-JUNG ; HSU CHINN</creatorcontrib><description>An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080520&amp;DB=EPODOC&amp;CC=US&amp;NR=7374293B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080520&amp;DB=EPODOC&amp;CC=US&amp;NR=7374293B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WU SHYAN-I</creatorcontrib><creatorcontrib>LIN YI-LI</creatorcontrib><creatorcontrib>LI KUANG-JUNG</creatorcontrib><creatorcontrib>HSU CHINN</creatorcontrib><title>Apparatus, system and method for testing electronic elements</title><description>An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLBxLChILEosKS3WUSiuLC5JzVVIzEtRyE0tychPUUjLL1IoSS0uycxLV0jNSU0uKcrPy0wGMXNT80qKeRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwubG5iZGlsZORMRFKAKSGL9s</recordid><startdate>20080520</startdate><enddate>20080520</enddate><creator>WU SHYAN-I</creator><creator>LIN YI-LI</creator><creator>LI KUANG-JUNG</creator><creator>HSU CHINN</creator><scope>EVB</scope></search><sort><creationdate>20080520</creationdate><title>Apparatus, system and method for testing electronic elements</title><author>WU SHYAN-I ; LIN YI-LI ; LI KUANG-JUNG ; HSU CHINN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7374293B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WU SHYAN-I</creatorcontrib><creatorcontrib>LIN YI-LI</creatorcontrib><creatorcontrib>LI KUANG-JUNG</creatorcontrib><creatorcontrib>HSU CHINN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WU SHYAN-I</au><au>LIN YI-LI</au><au>LI KUANG-JUNG</au><au>HSU CHINN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus, system and method for testing electronic elements</title><date>2008-05-20</date><risdate>2008</risdate><abstract>An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US7374293B2
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Apparatus, system and method for testing electronic elements
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-12T15%3A28%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WU%20SHYAN-I&rft.date=2008-05-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7374293B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true