Reduced pin count test method and apparatus

Testing of an electronic device is carried out by combining power and signal delivery on a single pair of wires. The power delivery is decoupled from the signal delivery, using inductors, so the device power supplied does not interfere with the test signals delivered from the device and the response...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	WEST BURNELL G
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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