Low-current pogo probe card

A low-current pogo probe card for measuring currents down to the femtoamp region includes a laminate board having a layer of conductive traces interposed between to dielectric layers. A plurality of probing devices, such as ceramic blades, are edge-mounted about a central opening so that the probing...

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Hauptverfasser:	COWAN CLARENCE E, TERVO PAUL A
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NATURAL OR ARTIFICIAL THREADS OR FIBRES PHYSICS PRELIMINARY TREATMENT OF FIBRES, e.g. FOR SPINNING SEMICONDUCTOR DEVICES SPINNING TESTING TEXTILES
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creator	COWAN CLARENCE E TERVO PAUL A
description	A low-current pogo probe card for measuring currents down to the femtoamp region includes a laminate board having a layer of conductive traces interposed between to dielectric layers. A plurality of probing devices, such as ceramic blades, are edge-mounted about a central opening so that the probing needles or needles included therein terminate below the opening in a pattern suitable for probing a test subject workpiece. A plurality of pogo pin receiving pad sets, each including a guard pad, occupy the periphery of the board. Each guard pad is electrically connected to a trace from the layer of conductive traces. The pad sets may be connected to the probing devices by low noise cables or traces. Air trenches separate the pad sets for reducing cross talk and signal settling times.
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NATURAL OR ARTIFICIAL THREADS OR FIBRES PHYSICS PRELIMINARY TREATMENT OF FIBRES, e.g. FOR SPINNING SEMICONDUCTOR DEVICES SPINNING TESTING TEXTILES
title	Low-current pogo probe card
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