Integrated circuit device including a scan test circuit and methods of testing the same

Integrated circuit devices include a core block having a plurality of output ports and a plurality of input ports and a vector input terminal. The core block generates core internal data responsive to output data from the input ports and is configured to output the core internal data during scan tes...

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Bibliographische Detailangaben
Hauptverfasser: KIM YONGUN, CHUNG SEUNG-JAE
Format: Patent
Sprache:eng
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