Apparatus and method for testing memory cards

A memory daughter card (MDC) is described, having a very high-speed serial interface and an on-card MDC test engine that allows one MDC to be directly connected to another MDC for testing purposes. In some embodiments, a control interface allows the test engine to be programmed and controlled by a t...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SCHWOERER GERALD A, GROSSMEIER ALAN M, RESNICK DAVID R, MARQUARDT KELLY J, STEINBERGER MICHAEL L, BETHARD ROGER A, SNYDER VAN L
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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