Photoresist suitable for use in 157 nm photolithography and including a polymer based on fluorinated norbornene derivatives

A photoresist that is suitable for use in 157 nm photolithography includes a polymer based on fluorinated norbornene derivatives.

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Bibliographische Detailangaben
Hauptverfasser: DAMMEL RALPH, HOHLE CHRISTOPH, HOULIHAN MICHAEL FRANCIS
Format: Patent
Sprache:eng
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