Scanning electrochemical potential microscope
An apparatus and method of determining a potential at a surface of a sample in a polar liquid, for example, across an electrical double layer, includes the step of immersing the sample in a polar solution to form a potential gradient at the surface. A tip of a scanning probe microscope probe is then...
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| creator | KJOLLER KEVIN J LI CHUNZENG |
| description | An apparatus and method of determining a potential at a surface of a sample in a polar liquid, for example, across an electrical double layer, includes the step of immersing the sample in a polar solution to form a potential gradient at the surface. A tip of a scanning probe microscope probe is then positioned in the solution generally adjacent the surface. During operation, the method includes measuring a potential of the probe. Relative scanning movement between the sample and the probe may be provided, and, in one mode of operation, a feedback signal is generated based on the measured potential. In that case, the tip may be moved generally orthogonal to the surface in response to the feedback signal to maintain a generally constant separation therebetween. The polar solution may have an associated ionic concentration, and the ionic concentration can be modified to tune the operation of the SEPM. |
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A tip of a scanning probe microscope probe is then positioned in the solution generally adjacent the surface. During operation, the method includes measuring a potential of the probe. Relative scanning movement between the sample and the probe may be provided, and, in one mode of operation, a feedback signal is generated based on the measured potential. In that case, the tip may be moved generally orthogonal to the surface in response to the feedback signal to maintain a generally constant separation therebetween. 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A tip of a scanning probe microscope probe is then positioned in the solution generally adjacent the surface. During operation, the method includes measuring a potential of the probe. Relative scanning movement between the sample and the probe may be provided, and, in one mode of operation, a feedback signal is generated based on the measured potential. In that case, the tip may be moved generally orthogonal to the surface in response to the feedback signal to maintain a generally constant separation therebetween. The polar solution may have an associated ionic concentration, and the ionic concentration can be modified to tune the operation of the SEPM.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Scanning electrochemical potential microscope |
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