Sample inspection apparatus

Sample inspection apparatus

A sample inspection apparatus comprises a sample support; a detection system for detecting radiation emitted by or transmitted through a sample on the sample support in response to radiation incident on the sample; and a cooling system for cooling at least one of the sample support and detection sys...

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Hauptverfasser: TURNER DANIEL FRANK, BHADARE SANTOKH SINGH, BARKSHIRE IAN RICHARD
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
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creator TURNER DANIEL FRANK
BHADARE SANTOKH SINGH
BARKSHIRE IAN RICHARD
description A sample inspection apparatus comprises a sample support; a detection system for detecting radiation emitted by or transmitted through a sample on the sample support in response to radiation incident on the sample; and a cooling system for cooling at least one of the sample support and detection system. The cooling system includes at least one oscillating, mechanical component which oscillates at a frequency different from the at least one of the support and detection system.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7151269B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7151269B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7151269B23</originalsourceid><addsrcrecordid>eNrjZJAOTswtyElVyMwrLkhNLsnMz1NILChILEosKS3mYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocHmhqaGRmaWTkbGRCgBAFS2I4E</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Sample inspection apparatus</title><source>esp@cenet</source><creator>TURNER DANIEL FRANK ; BHADARE SANTOKH SINGH ; BARKSHIRE IAN RICHARD</creator><creatorcontrib>TURNER DANIEL FRANK ; BHADARE SANTOKH SINGH ; BARKSHIRE IAN RICHARD</creatorcontrib><description>A sample inspection apparatus comprises a sample support; a detection system for detecting radiation emitted by or transmitted through a sample on the sample support in response to radiation incident on the sample; and a cooling system for cooling at least one of the sample support and detection system. The cooling system includes at least one oscillating, mechanical component which oscillates at a frequency different from the at least one of the support and detection system.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20061219&amp;DB=EPODOC&amp;CC=US&amp;NR=7151269B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20061219&amp;DB=EPODOC&amp;CC=US&amp;NR=7151269B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TURNER DANIEL FRANK</creatorcontrib><creatorcontrib>BHADARE SANTOKH SINGH</creatorcontrib><creatorcontrib>BARKSHIRE IAN RICHARD</creatorcontrib><title>Sample inspection apparatus</title><description>A sample inspection apparatus comprises a sample support; a detection system for detecting radiation emitted by or transmitted through a sample on the sample support in response to radiation incident on the sample; and a cooling system for cooling at least one of the sample support and detection system. The cooling system includes at least one oscillating, mechanical component which oscillates at a frequency different from the at least one of the support and detection system.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAOTswtyElVyMwrLkhNLsnMz1NILChILEosKS3mYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocHmhqaGRmaWTkbGRCgBAFS2I4E</recordid><startdate>20061219</startdate><enddate>20061219</enddate><creator>TURNER DANIEL FRANK</creator><creator>BHADARE SANTOKH SINGH</creator><creator>BARKSHIRE IAN RICHARD</creator><scope>EVB</scope></search><sort><creationdate>20061219</creationdate><title>Sample inspection apparatus</title><author>TURNER DANIEL FRANK ; BHADARE SANTOKH SINGH ; BARKSHIRE IAN RICHARD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7151269B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>TURNER DANIEL FRANK</creatorcontrib><creatorcontrib>BHADARE SANTOKH SINGH</creatorcontrib><creatorcontrib>BARKSHIRE IAN RICHARD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TURNER DANIEL FRANK</au><au>BHADARE SANTOKH SINGH</au><au>BARKSHIRE IAN RICHARD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Sample inspection apparatus</title><date>2006-12-19</date><risdate>2006</risdate><abstract>A sample inspection apparatus comprises a sample support; a detection system for detecting radiation emitted by or transmitted through a sample on the sample support in response to radiation incident on the sample; and a cooling system for cooling at least one of the sample support and detection system. The cooling system includes at least one oscillating, mechanical component which oscillates at a frequency different from the at least one of the support and detection system.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
title Sample inspection apparatus
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-20T09%3A25%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TURNER%20DANIEL%20FRANK&rft.date=2006-12-19&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7151269B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true