Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability

A method and system for determining minimum post production test time on an integrated circuit device to achieve optimal reliability of that device utilizing defect counts. The number of defective cells or active elements with defective cells (DEFECTS) on the integrated circuit device are counted an...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	BARNETT THOMAS S, HUOTT WILLIAM VINCENT, OUELLETTE MICHAEL RICHARD, BARBOUR TANGE NAN, GRADY MATTHEW SEAN
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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