Characterizing distribution signatures in integrated circuit technology

A method and system of processing tester information of a system under test is provided. Data of a tested characteristic of the system under test is generated. A distribution curve is extracted from the data. A signature of the distribution curve is determined, and a map of the signature on a depict...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	WANG JOHN J, TSIANG JERRY H. G, SHETTY SHIVANANDA S, ERHARDT JEFFREY P, STEFFAN PAUL J, WU FRANKLYN SHIHYU
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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