Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects
A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and p...
Gespeichert in:
| Hauptverfasser: | , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | GLENN ANNE W SHAW PETER G GLENN DAVID F PROPP W. ALAN MATTHERN GRETCHEN E |
| description | A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at other of the electrodes in response to applying the sinusoidal voltage to the select number of electrodes, determining impedance values from the gain and phase angle measurements, computing an impedance spectrum for an area of the material from the determined impedance values, and comparing the computed impedance spectrum with a known impedance spectrum to identify spatial locations of defects in the material. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US7088115B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US7088115B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US7088115B13</originalsourceid><addsrcrecordid>eNqNjDEKAjEURLexEPUO_wKCi4hbKyv2ar2En4kbSPJDfpq9vUE8gNUMzJu37twYwLUIz4ieTSAfM6xJDNL8XZQlL6SLVkQyyVJEncUqOSlkUVGiTz69G2-qb4Yg3IokJXENcM2i227lTFDsfrnp6DY-r_c9skxoT0ZCnV6P82EY-v506Y9_IB-WtEBn</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects</title><source>esp@cenet</source><creator>GLENN ANNE W ; SHAW PETER G ; GLENN DAVID F ; PROPP W. ALAN ; MATTHERN GRETCHEN E</creator><creatorcontrib>GLENN ANNE W ; SHAW PETER G ; GLENN DAVID F ; PROPP W. ALAN ; MATTHERN GRETCHEN E</creatorcontrib><description>A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at other of the electrodes in response to applying the sinusoidal voltage to the select number of electrodes, determining impedance values from the gain and phase angle measurements, computing an impedance spectrum for an area of the material from the determined impedance values, and comparing the computed impedance spectrum with a known impedance spectrum to identify spatial locations of defects in the material.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING ELECTRIC VARIABLES ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060808&DB=EPODOC&CC=US&NR=7088115B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060808&DB=EPODOC&CC=US&NR=7088115B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GLENN ANNE W</creatorcontrib><creatorcontrib>SHAW PETER G</creatorcontrib><creatorcontrib>GLENN DAVID F</creatorcontrib><creatorcontrib>PROPP W. ALAN</creatorcontrib><creatorcontrib>MATTHERN GRETCHEN E</creatorcontrib><title>Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects</title><description>A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at other of the electrodes in response to applying the sinusoidal voltage to the select number of electrodes, determining impedance values from the gain and phase angle measurements, computing an impedance spectrum for an area of the material from the determined impedance values, and comparing the computed impedance spectrum with a known impedance spectrum to identify spatial locations of defects in the material.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjDEKAjEURLexEPUO_wKCi4hbKyv2ar2En4kbSPJDfpq9vUE8gNUMzJu37twYwLUIz4ieTSAfM6xJDNL8XZQlL6SLVkQyyVJEncUqOSlkUVGiTz69G2-qb4Yg3IokJXENcM2i227lTFDsfrnp6DY-r_c9skxoT0ZCnV6P82EY-v506Y9_IB-WtEBn</recordid><startdate>20060808</startdate><enddate>20060808</enddate><creator>GLENN ANNE W</creator><creator>SHAW PETER G</creator><creator>GLENN DAVID F</creator><creator>PROPP W. ALAN</creator><creator>MATTHERN GRETCHEN E</creator><scope>EVB</scope></search><sort><creationdate>20060808</creationdate><title>Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects</title><author>GLENN ANNE W ; SHAW PETER G ; GLENN DAVID F ; PROPP W. ALAN ; MATTHERN GRETCHEN E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US7088115B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>GLENN ANNE W</creatorcontrib><creatorcontrib>SHAW PETER G</creatorcontrib><creatorcontrib>GLENN DAVID F</creatorcontrib><creatorcontrib>PROPP W. ALAN</creatorcontrib><creatorcontrib>MATTHERN GRETCHEN E</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GLENN ANNE W</au><au>SHAW PETER G</au><au>GLENN DAVID F</au><au>PROPP W. ALAN</au><au>MATTHERN GRETCHEN E</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects</title><date>2006-08-08</date><risdate>2006</risdate><abstract>A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at other of the electrodes in response to applying the sinusoidal voltage to the select number of electrodes, determining impedance values from the gain and phase angle measurements, computing an impedance spectrum for an area of the material from the determined impedance values, and comparing the computed impedance spectrum with a known impedance spectrum to identify spatial locations of defects in the material.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US7088115B1 |
| source | esp@cenet |
| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING ELECTRIC VARIABLES MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T18%3A49%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=GLENN%20ANNE%20W&rft.date=2006-08-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS7088115B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |