Semiconductor device and method for fabricating the same

Impurities for threshold voltage adjustment are implanted using a resist film and a protective dielectric as implantation masks from directions inclined at 10° through 30° with respect to the direction vertical to the principal surface of a semiconductor substrate 1 when viewed in cross section take...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: YAMADA TAKAYUKI, SEBE AKIO, NAKAOKA HIROAKI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!