Method and apparatus for internal feature reconstruction
A method for reconstructing internal surface geometry of a part includes registering a thickness map for the part with external surface data for the part. The thickness map has a number of thickness data. Internal surface data is generated using the thickness map and the external surface data to rec...
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| creator | REBELLO ALEXANDER BERNARD FLAVIAN HOWARD DONALD ROBERT HARDING KEVIN GEORGE |
| description | A method for reconstructing internal surface geometry of a part includes registering a thickness map for the part with external surface data for the part. The thickness map has a number of thickness data. Internal surface data is generated using the thickness map and the external surface data to reconstruct the internal surface geometry. |
| format | Patent |
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| language | eng |
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| subjects | COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIATION PYROMETRY TESTING |
| title | Method and apparatus for internal feature reconstruction |
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