Method of analyzing gas using quartz oscillator and apparatus therefor

Method of analyzing gas using quartz oscillator and apparatus therefor

A gas analyzing apparatus including a reactor for decomposing a target substance contained in a gas to produce a product gas containing a decomposition product, a contacting chamber connected to the reactor and having a quartz oscillator disposed therewithin. The quartz oscillator has opposing surfa...

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Hauptverfasser: KOBAYASHI KOUTA, NODA KAZUTOSHI, MATSUNOBU KUNITOSHI, UCHIDA KATSUHIDE, NAGANAWA RYUICHI
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator KOBAYASHI KOUTA
NODA KAZUTOSHI
MATSUNOBU KUNITOSHI
UCHIDA KATSUHIDE
NAGANAWA RYUICHI
description A gas analyzing apparatus including a reactor for decomposing a target substance contained in a gas to produce a product gas containing a decomposition product, a contacting chamber connected to the reactor and having a quartz oscillator disposed therewithin. The quartz oscillator has opposing surfaces each provided with an electrode, at least one of the electrodes being reactable with the decomposition product so that the decomposition product when contacted with the reactable electrode is reacted with the reactable electrode to cause a frequency deviation which is detected by a frequency measuring device.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Method of analyzing gas using quartz oscillator and apparatus therefor
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