Data accelerator and methods for increasing data throughput

A data accelerator for use in a test vector sequencer includes a data translator, a plurality of sequence memory devices, and a switch. The data translator and the switch are configured via a control signal responsive to an indication that a first sequence memory device is prepared to receive a data...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: WILLIAMSON, JR. EDDIE L, WIBLE KEVIN LEE, ROZUM STEPHEN P
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator WILLIAMSON, JR. EDDIE L
WIBLE KEVIN LEE
ROZUM STEPHEN P
description A data accelerator for use in a test vector sequencer includes a data translator, a plurality of sequence memory devices, and a switch. The data translator and the switch are configured via a control signal responsive to an indication that a first sequence memory device is prepared to receive a data segment and that a second sequence memory device is prepared to transfer a previously stored data segment. The test sequencer forwards a first application segment to a first memory device and acquires a subsequent application with a second memory device, detects a condition responsive to the completion of the segment acquisition and forwarding tasks, switches the roles of the first and second memory devices, and repeatedly switches and detects until all application segments have been processed.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6826721B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6826721B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6826721B23</originalsourceid><addsrcrecordid>eNrjZLB2SSxJVEhMTk7NSS1KLMkvUkjMS1HITS3JyE8pVkgD8jPzkotSE4sz89IVUkBqSzKK8kvTMwpKS3gYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSXxosJmFkZm5kaGTkTERSgBZ5y9Y</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Data accelerator and methods for increasing data throughput</title><source>esp@cenet</source><creator>WILLIAMSON, JR. EDDIE L ; WIBLE KEVIN LEE ; ROZUM STEPHEN P</creator><creatorcontrib>WILLIAMSON, JR. EDDIE L ; WIBLE KEVIN LEE ; ROZUM STEPHEN P</creatorcontrib><description>A data accelerator for use in a test vector sequencer includes a data translator, a plurality of sequence memory devices, and a switch. The data translator and the switch are configured via a control signal responsive to an indication that a first sequence memory device is prepared to receive a data segment and that a second sequence memory device is prepared to transfer a previously stored data segment. The test sequencer forwards a first application segment to a first memory device and acquires a subsequent application with a second memory device, detects a condition responsive to the completion of the segment acquisition and forwarding tasks, switches the roles of the first and second memory devices, and repeatedly switches and detects until all application segments have been processed.</description><edition>7</edition><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20041130&amp;DB=EPODOC&amp;CC=US&amp;NR=6826721B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20041130&amp;DB=EPODOC&amp;CC=US&amp;NR=6826721B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WILLIAMSON, JR. EDDIE L</creatorcontrib><creatorcontrib>WIBLE KEVIN LEE</creatorcontrib><creatorcontrib>ROZUM STEPHEN P</creatorcontrib><title>Data accelerator and methods for increasing data throughput</title><description>A data accelerator for use in a test vector sequencer includes a data translator, a plurality of sequence memory devices, and a switch. The data translator and the switch are configured via a control signal responsive to an indication that a first sequence memory device is prepared to receive a data segment and that a second sequence memory device is prepared to transfer a previously stored data segment. The test sequencer forwards a first application segment to a first memory device and acquires a subsequent application with a second memory device, detects a condition responsive to the completion of the segment acquisition and forwarding tasks, switches the roles of the first and second memory devices, and repeatedly switches and detects until all application segments have been processed.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB2SSxJVEhMTk7NSS1KLMkvUkjMS1HITS3JyE8pVkgD8jPzkotSE4sz89IVUkBqSzKK8kvTMwpKS3gYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSXxosJmFkZm5kaGTkTERSgBZ5y9Y</recordid><startdate>20041130</startdate><enddate>20041130</enddate><creator>WILLIAMSON, JR. EDDIE L</creator><creator>WIBLE KEVIN LEE</creator><creator>ROZUM STEPHEN P</creator><scope>EVB</scope></search><sort><creationdate>20041130</creationdate><title>Data accelerator and methods for increasing data throughput</title><author>WILLIAMSON, JR. EDDIE L ; WIBLE KEVIN LEE ; ROZUM STEPHEN P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6826721B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WILLIAMSON, JR. EDDIE L</creatorcontrib><creatorcontrib>WIBLE KEVIN LEE</creatorcontrib><creatorcontrib>ROZUM STEPHEN P</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WILLIAMSON, JR. EDDIE L</au><au>WIBLE KEVIN LEE</au><au>ROZUM STEPHEN P</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Data accelerator and methods for increasing data throughput</title><date>2004-11-30</date><risdate>2004</risdate><abstract>A data accelerator for use in a test vector sequencer includes a data translator, a plurality of sequence memory devices, and a switch. The data translator and the switch are configured via a control signal responsive to an indication that a first sequence memory device is prepared to receive a data segment and that a second sequence memory device is prepared to transfer a previously stored data segment. The test sequencer forwards a first application segment to a first memory device and acquires a subsequent application with a second memory device, detects a condition responsive to the completion of the segment acquisition and forwarding tasks, switches the roles of the first and second memory devices, and repeatedly switches and detects until all application segments have been processed.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US6826721B2
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Data accelerator and methods for increasing data throughput
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T09%3A30%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WILLIAMSON,%20JR.%20EDDIE%20L&rft.date=2004-11-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS6826721B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true