Method and apparatus for testing a non-standard memory device under actual operating conditions

A method and apparatus for testing memory devices under actual operating conditions can accommodate non-standard memory devices through the use of an interface board that adapts a non-standard pin configuration to a standard pin configuration on a test substrate. The interface board can include a fi...

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Bibliographische Detailangaben

Hauptverfasser:	PARK SANG-JUN, KIM SUN-JU, PARK HYUN-HO, KIM CHANG-NYUN, SEO JIN-SEOP
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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