Plasma deposition method and system

There is provided a deposition technique wherein the amounts of eliminated F and H are small in the deposition of an insulating film, such as an SiOF film or an SiCHO film, which contains silicon, oxygen and other components and which has a lower dielectric constant than the dielectric constant of a...

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Bibliographische Detailangaben
1. Verfasser: AKAHORI TAKASHI
Format: Patent
Sprache:eng
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