Semiconductor device

A die size is reduced in a semiconductor device which has a gate electrode formed on a first gate insulation film and a second gate insulation film, source and drain regions (N- layers and N+ layers) formed adjacent to the gate electrode and a channel region, wherein at least the gate electrode, the...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NISHIBE EIJI, KIKUCHI SUICHI, MOMEN MASAAKI
Format: Patent
Sprache:eng
Schlagworte:
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