Apparatus and method for providing a diagnostic problem determination methodology for complex systems

An apparatus and method for performing a diagnostic problem determination methodology for complex systems is provided. With the apparatus and method, a diagnostic application for a system may automatically invoke additional diagnostics for child devices and/or siblings of the child devices based on...

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Bibliographische Detailangaben
Hauptverfasser:	TYSOR ARTHUR JAMES, BATTEN PAMELA ANN, BENIGNUS DOUGLAS MARVIN
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING CONVERSION OR DISTRIBUTION OF ELECTRIC POWER COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS GENERATION INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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Beschreibung
Zusammenfassung:	An apparatus and method for performing a diagnostic problem determination methodology for complex systems is provided. With the apparatus and method, a diagnostic application for a system may automatically invoke additional diagnostics for child devices and/or siblings of the child devices based on status of the child devices after testing the parent device. This allows for complete testing of a subsystem in a single diagnostic execution resulting in a more complete, accurate analysis of subsystems with complex configurations such as seen with redundant arrays of independent disk drive (RAID) systems.