Semiconductor device

A semiconductor device including a port circuit (301) connected to an internal circuit, external terminals to which the port circuit is connected and a boundary scanning circuit (180, 18), the boundary scanning circuit being the one that makes access to the external terminals through the test access...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KAWASAKI IKUYA, TSUKIMORI AKIFUMI, YOSHIOKA SHINICHI, NOGUCHI KOKI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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