Fault insertion using on-card reprogrammable devices
A method of inducing a fault within the boundary of an on-card reprogrammable logic device (RLD) by interactive injection of subtle candidate faults and comparison of expected error message from software diagnostics until all faults are tested. Upon completion of fault injection, the RLD is reprogra...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | KANIA MICHAEL J |
description | A method of inducing a fault within the boundary of an on-card reprogrammable logic device (RLD) by interactive injection of subtle candidate faults and comparison of expected error message from software diagnostics until all faults are tested. Upon completion of fault injection, the RLD is reprogrammed to its proper functional faultless state. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6704894B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6704894B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6704894B13</originalsourceid><addsrcrecordid>eNrjZDBxSyzNKVHIzCtOLSrJzM9TKC3OzEtXyM_TTU4sSlEoSi0oyk8vSszNTUzKSVVISS3LTE4t5mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHBZuYGJhaWJk6GxkQoAQD_vCzr</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Fault insertion using on-card reprogrammable devices</title><source>esp@cenet</source><creator>KANIA MICHAEL J</creator><creatorcontrib>KANIA MICHAEL J</creatorcontrib><description>A method of inducing a fault within the boundary of an on-card reprogrammable logic device (RLD) by interactive injection of subtle candidate faults and comparison of expected error message from software diagnostics until all faults are tested. Upon completion of fault injection, the RLD is reprogrammed to its proper functional faultless state.</description><edition>7</edition><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040309&DB=EPODOC&CC=US&NR=6704894B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040309&DB=EPODOC&CC=US&NR=6704894B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KANIA MICHAEL J</creatorcontrib><title>Fault insertion using on-card reprogrammable devices</title><description>A method of inducing a fault within the boundary of an on-card reprogrammable logic device (RLD) by interactive injection of subtle candidate faults and comparison of expected error message from software diagnostics until all faults are tested. Upon completion of fault injection, the RLD is reprogrammed to its proper functional faultless state.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBxSyzNKVHIzCtOLSrJzM9TKC3OzEtXyM_TTU4sSlEoSi0oyk8vSszNTUzKSVVISS3LTE4t5mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHBZuYGJhaWJk6GxkQoAQD_vCzr</recordid><startdate>20040309</startdate><enddate>20040309</enddate><creator>KANIA MICHAEL J</creator><scope>EVB</scope></search><sort><creationdate>20040309</creationdate><title>Fault insertion using on-card reprogrammable devices</title><author>KANIA MICHAEL J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6704894B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KANIA MICHAEL J</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KANIA MICHAEL J</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Fault insertion using on-card reprogrammable devices</title><date>2004-03-09</date><risdate>2004</risdate><abstract>A method of inducing a fault within the boundary of an on-card reprogrammable logic device (RLD) by interactive injection of subtle candidate faults and comparison of expected error message from software diagnostics until all faults are tested. Upon completion of fault injection, the RLD is reprogrammed to its proper functional faultless state.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US6704894B1 |
source | esp@cenet |
subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Fault insertion using on-card reprogrammable devices |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T08%3A09%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KANIA%20MICHAEL%20J&rft.date=2004-03-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS6704894B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |