Facilitating comparisons between simulated and actual behavior of electronic devices

A system for analyzing the behavior of electronic devices includes a first database for storing simulation values and a second database for storing actual waveform values. The system further includes software for aligning the values stored in the first and second databases, so that simulated and act...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	MASELLA, JR. ANTHONY, WEBSTER BRUCE A
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	MASELLA, JR. ANTHONY WEBSTER BRUCE A
description	A system for analyzing the behavior of electronic devices includes a first database for storing simulation values and a second database for storing actual waveform values. The system further includes software for aligning the values stored in the first and second databases, so that simulated and actual values can be readily compared. Analysis tools are included for examining similarities and differences between simulated and actual behavior.
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6684169B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6684169B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6684169B23</originalsourceid><addsrcrecordid>eNqNijsOwjAQBdNQIOAOewEKPoqgBRHRE-po2byQlRzbsjfh-qTgABSjKWaWRV2xqFNjU_8mCUPkpDn4TC_YB_CUdRgdG1piPyM2sptjz5OGRKEjOIil4FWoxaSCvC4WHbuMzc-rgqpbfb1vEUODHFngYc3zUZan4648X_aHP5YviXk5SQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Facilitating comparisons between simulated and actual behavior of electronic devices</title><source>esp@cenet</source><creator>MASELLA, JR. ANTHONY ; WEBSTER BRUCE A</creator><creatorcontrib>MASELLA, JR. ANTHONY ; WEBSTER BRUCE A</creatorcontrib><description>A system for analyzing the behavior of electronic devices includes a first database for storing simulation values and a second database for storing actual waveform values. The system further includes software for aligning the values stored in the first and second databases, so that simulated and actual values can be readily compared. Analysis tools are included for examining similarities and differences between simulated and actual behavior.</description><edition>7</edition><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040127&DB=EPODOC&CC=US&NR=6684169B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040127&DB=EPODOC&CC=US&NR=6684169B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MASELLA, JR. ANTHONY</creatorcontrib><creatorcontrib>WEBSTER BRUCE A</creatorcontrib><title>Facilitating comparisons between simulated and actual behavior of electronic devices</title><description>A system for analyzing the behavior of electronic devices includes a first database for storing simulation values and a second database for storing actual waveform values. The system further includes software for aligning the values stored in the first and second databases, so that simulated and actual values can be readily compared. Analysis tools are included for examining similarities and differences between simulated and actual behavior.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijsOwjAQBdNQIOAOewEKPoqgBRHRE-po2byQlRzbsjfh-qTgABSjKWaWRV2xqFNjU_8mCUPkpDn4TC_YB_CUdRgdG1piPyM2sptjz5OGRKEjOIil4FWoxaSCvC4WHbuMzc-rgqpbfb1vEUODHFngYc3zUZan4648X_aHP5YviXk5SQ</recordid><startdate>20040127</startdate><enddate>20040127</enddate><creator>MASELLA, JR. ANTHONY</creator><creator>WEBSTER BRUCE A</creator><scope>EVB</scope></search><sort><creationdate>20040127</creationdate><title>Facilitating comparisons between simulated and actual behavior of electronic devices</title><author>MASELLA, JR. ANTHONY ; WEBSTER BRUCE A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6684169B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MASELLA, JR. ANTHONY</creatorcontrib><creatorcontrib>WEBSTER BRUCE A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MASELLA, JR. ANTHONY</au><au>WEBSTER BRUCE A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Facilitating comparisons between simulated and actual behavior of electronic devices</title><date>2004-01-27</date><risdate>2004</risdate><abstract>A system for analyzing the behavior of electronic devices includes a first database for storing simulation values and a second database for storing actual waveform values. The system further includes software for aligning the values stored in the first and second databases, so that simulated and actual values can be readily compared. Analysis tools are included for examining similarities and differences between simulated and actual behavior.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng
recordid	cdi_epo_espacenet_US6684169B2
source	esp@cenet
subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	Facilitating comparisons between simulated and actual behavior of electronic devices
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T17%3A29%3A42IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MASELLA,%20JR.%20ANTHONY&rft.date=2004-01-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS6684169B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true