Piston for module test

A test module having a lid to force a chip in contact with the test pads using a bed of nails to conform to the shape of the chip. The lengths of the nails are cut to conform to be of equal length above the chip with different size heads to apply the proper force. A pressurized bag may be placed abo...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: BEHUN JOHN RICHARD
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator BEHUN JOHN RICHARD
description A test module having a lid to force a chip in contact with the test pads using a bed of nails to conform to the shape of the chip. The lengths of the nails are cut to conform to be of equal length above the chip with different size heads to apply the proper force. A pressurized bag may be placed above the head of nails to apply force to the chip.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6683466B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6683466B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6683466B23</originalsourceid><addsrcrecordid>eNrjZBALyCwuyc9TSMsvUsjNTynNSVUoSS0u4WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHBZmYWxiZmZk5GxkQoAQBd-CFH</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Piston for module test</title><source>esp@cenet</source><creator>BEHUN JOHN RICHARD</creator><creatorcontrib>BEHUN JOHN RICHARD</creatorcontrib><description>A test module having a lid to force a chip in contact with the test pads using a bed of nails to conform to the shape of the chip. The lengths of the nails are cut to conform to be of equal length above the chip with different size heads to apply the proper force. A pressurized bag may be placed above the head of nails to apply force to the chip.</description><edition>7</edition><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20040127&amp;DB=EPODOC&amp;CC=US&amp;NR=6683466B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20040127&amp;DB=EPODOC&amp;CC=US&amp;NR=6683466B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BEHUN JOHN RICHARD</creatorcontrib><title>Piston for module test</title><description>A test module having a lid to force a chip in contact with the test pads using a bed of nails to conform to the shape of the chip. The lengths of the nails are cut to conform to be of equal length above the chip with different size heads to apply the proper force. A pressurized bag may be placed above the head of nails to apply force to the chip.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBALyCwuyc9TSMsvUsjNTynNSVUoSS0u4WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHBZmYWxiZmZk5GxkQoAQBd-CFH</recordid><startdate>20040127</startdate><enddate>20040127</enddate><creator>BEHUN JOHN RICHARD</creator><scope>EVB</scope></search><sort><creationdate>20040127</creationdate><title>Piston for module test</title><author>BEHUN JOHN RICHARD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6683466B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BEHUN JOHN RICHARD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BEHUN JOHN RICHARD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Piston for module test</title><date>2004-01-27</date><risdate>2004</risdate><abstract>A test module having a lid to force a chip in contact with the test pads using a bed of nails to conform to the shape of the chip. The lengths of the nails are cut to conform to be of equal length above the chip with different size heads to apply the proper force. A pressurized bag may be placed above the head of nails to apply force to the chip.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US6683466B2
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Piston for module test
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T23%3A51%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BEHUN%20JOHN%20RICHARD&rft.date=2004-01-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS6683466B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true