Feed forward testing

A method of testing an integrated circuit. A first subset of test parameters is selected from a full set of test parameters designed to characterize given properties of the integrated circuit. A first subset of devices in the integrated circuit is tested with the first subset of test parameters, usi...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	MADGE ROBERT
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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