Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory

An apparatus and method in an event based test system for testing an electronics device under test (DUT). The apparatus includes an event memory for storing timing data and event type data of each event wherein the timing data of a current event is expressed by a delay time from an event immediately...

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Bibliographische Detailangaben

Hauptverfasser:	TURNQUIST JAMES ALAN, LE ANTHONY, GOMES GLEN A, RAJUSMAN ROCHIT, SUGAMORI SHIGERU
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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