Method of manufacturing a semiconductor device comprising MOS-transistors having gate oxides of different thicknesses

Method of manufacturing a semiconductor device comprising MOS-transistors of a first type (A) having a gate oxide (3) of a first thickness and MOS-transistors of a second type (B) having a gate oxide (10) of a second, greater thickness. In this method, active regions (4) and field oxide regions (5)...

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Bibliographische Detailangaben
Hauptverfasser: DRUIJF KLAAS GERBRAND, VAN DER MEER HENDRIK HUBERTUS
Format: Patent
Sprache:eng
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