Method and apparatus for wavefront measurement that resolves the 2-pi ambiguity in such measurement and adaptive optics systems utilizing same

An improved wavefront sensor for characterizing phase distortions in incident light including optical elements that spatially sample the incident light and form a dispersed spot with a fringe pattern corresponding to samples of the incident light. An imaging device captures an image of the dispersed...

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1. Verfasser: WIRTH ALLAN
Format: Patent
Sprache:eng
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