Method for fabricating semiconductor device including self aligned gate

An method for fabricating a semiconductor device reduces a size of a MOSFET by self aligning a gate electrode with a device isolation insulation film. Thus, the gate electrode is not overlapped with the device isolation insulation film, differently from a conventional method for forming a MOSFET by...

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Bibliographische Detailangaben
1. Verfasser: KIM JAE KAP
Format: Patent
Sprache:eng
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