Monitoring system for determining progress in a fabrication activity
Method for fabricating a structure. According to an exemplary embodiment, a structure is made by forming a layer of removable material with a first surface spaced a part from a second surface. The first surface is formed along a first region from which the material is removable. The first surface is...
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| creator | VARTULI CATHERINE HOUGE ERIK CHO MCINTOSH JOHN MARTIN KIZILYALLI ISIK C STEVIE FRED ANTHONY |
| description | Method for fabricating a structure. According to an exemplary embodiment, a structure is made by forming a layer of removable material with a first surface spaced a part from a second surface. The first surface is formed along a first region from which the material is removable. The first surface is altered by removal of material from the layer. Removed material from the first surface is monitored to detect fluctuations in a variable of composition in the layer, and removal of material from the first surface is terminated when the composition of monitored material meets a predetermined criterion. In an alternate embodiment a variable characteristic is imparted to a layer of material as a function of layer thickness and an operation is performed on the layer resulting in removal of material. Samples of removed material are monitored for variation in the characteristic and the operation is modified when a variation conforms with a criterion. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6569690B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6569690B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6569690B13</originalsourceid><addsrcrecordid>eNrjZHDxzc_LLMkvysxLVyiuLC5JzVVIyy9SSEktSS3KzcwDCRcU5acXpRYXK2TmKSQqpCUmFWUmJ5Zk5gN5ySWZZZkllTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JD402MzUzNLM0sDJ0JgIJQCrkDNR</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Monitoring system for determining progress in a fabrication activity</title><source>esp@cenet</source><creator>VARTULI CATHERINE ; HOUGE ERIK CHO ; MCINTOSH JOHN MARTIN ; KIZILYALLI ISIK C ; STEVIE FRED ANTHONY</creator><creatorcontrib>VARTULI CATHERINE ; HOUGE ERIK CHO ; MCINTOSH JOHN MARTIN ; KIZILYALLI ISIK C ; STEVIE FRED ANTHONY</creatorcontrib><description>Method for fabricating a structure. According to an exemplary embodiment, a structure is made by forming a layer of removable material with a first surface spaced a part from a second surface. The first surface is formed along a first region from which the material is removable. The first surface is altered by removal of material from the layer. Removed material from the first surface is monitored to detect fluctuations in a variable of composition in the layer, and removal of material from the first surface is terminated when the composition of monitored material meets a predetermined criterion. In an alternate embodiment a variable characteristic is imparted to a layer of material as a function of layer thickness and an operation is performed on the layer resulting in removal of material. Samples of removed material are monitored for variation in the characteristic and the operation is modified when a variation conforms with a criterion.</description><edition>7</edition><language>eng</language><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES ; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS ; GRINDING ; MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING ; PERFORMING OPERATIONS ; POLISHING ; TRANSPORTING</subject><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030527&DB=EPODOC&CC=US&NR=6569690B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20030527&DB=EPODOC&CC=US&NR=6569690B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VARTULI CATHERINE</creatorcontrib><creatorcontrib>HOUGE ERIK CHO</creatorcontrib><creatorcontrib>MCINTOSH JOHN MARTIN</creatorcontrib><creatorcontrib>KIZILYALLI ISIK C</creatorcontrib><creatorcontrib>STEVIE FRED ANTHONY</creatorcontrib><title>Monitoring system for determining progress in a fabrication activity</title><description>Method for fabricating a structure. According to an exemplary embodiment, a structure is made by forming a layer of removable material with a first surface spaced a part from a second surface. The first surface is formed along a first region from which the material is removable. The first surface is altered by removal of material from the layer. Removed material from the first surface is monitored to detect fluctuations in a variable of composition in the layer, and removal of material from the first surface is terminated when the composition of monitored material meets a predetermined criterion. In an alternate embodiment a variable characteristic is imparted to a layer of material as a function of layer thickness and an operation is performed on the layer resulting in removal of material. Samples of removed material are monitored for variation in the characteristic and the operation is modified when a variation conforms with a criterion.</description><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES</subject><subject>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</subject><subject>GRINDING</subject><subject>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</subject><subject>PERFORMING OPERATIONS</subject><subject>POLISHING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDxzc_LLMkvysxLVyiuLC5JzVVIyy9SSEktSS3KzcwDCRcU5acXpRYXK2TmKSQqpCUmFWUmJ5Zk5gN5ySWZZZkllTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JD402MzUzNLM0sDJ0JgIJQCrkDNR</recordid><startdate>20030527</startdate><enddate>20030527</enddate><creator>VARTULI CATHERINE</creator><creator>HOUGE ERIK CHO</creator><creator>MCINTOSH JOHN MARTIN</creator><creator>KIZILYALLI ISIK C</creator><creator>STEVIE FRED ANTHONY</creator><scope>EVB</scope></search><sort><creationdate>20030527</creationdate><title>Monitoring system for determining progress in a fabrication activity</title><author>VARTULI CATHERINE ; HOUGE ERIK CHO ; MCINTOSH JOHN MARTIN ; KIZILYALLI ISIK C ; STEVIE FRED ANTHONY</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6569690B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><topic>DRESSING OR CONDITIONING OF ABRADING SURFACES</topic><topic>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</topic><topic>GRINDING</topic><topic>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</topic><topic>PERFORMING OPERATIONS</topic><topic>POLISHING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>VARTULI CATHERINE</creatorcontrib><creatorcontrib>HOUGE ERIK CHO</creatorcontrib><creatorcontrib>MCINTOSH JOHN MARTIN</creatorcontrib><creatorcontrib>KIZILYALLI ISIK C</creatorcontrib><creatorcontrib>STEVIE FRED ANTHONY</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VARTULI CATHERINE</au><au>HOUGE ERIK CHO</au><au>MCINTOSH JOHN MARTIN</au><au>KIZILYALLI ISIK C</au><au>STEVIE FRED ANTHONY</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Monitoring system for determining progress in a fabrication activity</title><date>2003-05-27</date><risdate>2003</risdate><abstract>Method for fabricating a structure. According to an exemplary embodiment, a structure is made by forming a layer of removable material with a first surface spaced a part from a second surface. The first surface is formed along a first region from which the material is removable. The first surface is altered by removal of material from the layer. Removed material from the first surface is monitored to detect fluctuations in a variable of composition in the layer, and removal of material from the first surface is terminated when the composition of monitored material meets a predetermined criterion. In an alternate embodiment a variable characteristic is imparted to a layer of material as a function of layer thickness and an operation is performed on the layer resulting in removal of material. Samples of removed material are monitored for variation in the characteristic and the operation is modified when a variation conforms with a criterion.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | DRESSING OR CONDITIONING OF ABRADING SURFACES FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS GRINDING MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING PERFORMING OPERATIONS POLISHING TRANSPORTING |
| title | Monitoring system for determining progress in a fabrication activity |
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