Multiple local probe measuring device and method

A local probe measuring device is provided for effecting local measurements of a sample. This device includes first and second local probes for local measurements with respect to a sample or a reference surface. A measurement condition adjustment arrangement is adapted to commonly adjust first and s...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ALTMANN STEPHAN MAXIMILIAN, HOERBER JOHANN KARL HEINRICH
Format:	Patent
Sprache:	eng
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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