Mechanism for broadside reads of CAM structures

A CAM providing for the identification of a plurality of multiple bit tag values stored in the CAM, having logic circuitry for comparing each bit of an inputted test value to the corresponding bits of all stored tag values. A bit select is employed for generating a plurality of test bits for sequent...

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Hauptverfasser: LYON TERRY L, UNDY STEPHEN R
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creator LYON TERRY L
UNDY STEPHEN R
description A CAM providing for the identification of a plurality of multiple bit tag values stored in the CAM, having logic circuitry for comparing each bit of an inputted test value to the corresponding bits of all stored tag values. A bit select is employed for generating a plurality of test bits for sequential input into the logic circuitry. The logic circuitry compares the plurality of test bits to the corresponding bit of each stored tag value and generates a "hit" signal if the selected bit is the same as the corresponding bit of the stored tag value. Storage means are employed for recording the results of the compare with the M hit signal.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6493792B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6493792B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6493792B13</originalsourceid><addsrcrecordid>eNrjZND3TU3OSMzLLM5VSMsvUkgqyk9MKc5MSVUoSgUyFPLTFJwdfRWKS4pKk0tKi1KLeRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwmYmlsbmlkZOhMRFKALELKlg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Mechanism for broadside reads of CAM structures</title><source>esp@cenet</source><creator>LYON TERRY L ; UNDY STEPHEN R</creator><creatorcontrib>LYON TERRY L ; UNDY STEPHEN R</creatorcontrib><description>A CAM providing for the identification of a plurality of multiple bit tag values stored in the CAM, having logic circuitry for comparing each bit of an inputted test value to the corresponding bits of all stored tag values. A bit select is employed for generating a plurality of test bits for sequential input into the logic circuitry. The logic circuitry compares the plurality of test bits to the corresponding bit of each stored tag value and generates a "hit" signal if the selected bit is the same as the corresponding bit of the stored tag value. Storage means are employed for recording the results of the compare with the M hit signal.</description><edition>7</edition><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20021210&amp;DB=EPODOC&amp;CC=US&amp;NR=6493792B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20021210&amp;DB=EPODOC&amp;CC=US&amp;NR=6493792B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LYON TERRY L</creatorcontrib><creatorcontrib>UNDY STEPHEN R</creatorcontrib><title>Mechanism for broadside reads of CAM structures</title><description>A CAM providing for the identification of a plurality of multiple bit tag values stored in the CAM, having logic circuitry for comparing each bit of an inputted test value to the corresponding bits of all stored tag values. A bit select is employed for generating a plurality of test bits for sequential input into the logic circuitry. The logic circuitry compares the plurality of test bits to the corresponding bit of each stored tag value and generates a "hit" signal if the selected bit is the same as the corresponding bit of the stored tag value. Storage means are employed for recording the results of the compare with the M hit signal.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZND3TU3OSMzLLM5VSMsvUkgqyk9MKc5MSVUoSgUyFPLTFJwdfRWKS4pKk0tKi1KLeRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwmYmlsbmlkZOhMRFKALELKlg</recordid><startdate>20021210</startdate><enddate>20021210</enddate><creator>LYON TERRY L</creator><creator>UNDY STEPHEN R</creator><scope>EVB</scope></search><sort><creationdate>20021210</creationdate><title>Mechanism for broadside reads of CAM structures</title><author>LYON TERRY L ; UNDY STEPHEN R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6493792B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2002</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>LYON TERRY L</creatorcontrib><creatorcontrib>UNDY STEPHEN R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LYON TERRY L</au><au>UNDY STEPHEN R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Mechanism for broadside reads of CAM structures</title><date>2002-12-10</date><risdate>2002</risdate><abstract>A CAM providing for the identification of a plurality of multiple bit tag values stored in the CAM, having logic circuitry for comparing each bit of an inputted test value to the corresponding bits of all stored tag values. A bit select is employed for generating a plurality of test bits for sequential input into the logic circuitry. The logic circuitry compares the plurality of test bits to the corresponding bit of each stored tag value and generates a "hit" signal if the selected bit is the same as the corresponding bit of the stored tag value. Storage means are employed for recording the results of the compare with the M hit signal.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
title Mechanism for broadside reads of CAM structures
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T19%3A52%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LYON%20TERRY%20L&rft.date=2002-12-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS6493792B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true