Radiographic flat panel detector

Radiographic flat panel detector

A glass substrate has formed on a front side thereof pixels each including a photoelectric conversion device, a capacitor and a TFT, and signal lines for reading signals via TFT's of the pixels, and on a back side thereof vertical selection lines for selecting the pixels, and has provided there...

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Hauptverfasser: TOMISAKI TAKAYUKI, SAKAGUCHI TAKUYA
Format: Patent
Sprache:eng
Schlagworte:
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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creator TOMISAKI TAKAYUKI
SAKAGUCHI TAKUYA
description A glass substrate has formed on a front side thereof pixels each including a photoelectric conversion device, a capacitor and a TFT, and signal lines for reading signals via TFT's of the pixels, and on a back side thereof vertical selection lines for selecting the pixels, and has provided therethrough electric contacts for interconnection between gates of the TFT's and the vertical selection lines. The signal lines and the vertical selection lines are in a crossing relationship at thickness distance across the substrate, with reduced wiring capacities therebetween.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6429436B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6429436B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6429436B13</originalsourceid><addsrcrecordid>eNrjZFAISkzJzE8vSizIyExWSMtJLFEoSMxLzVFISS1JTS7JL-JhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhwWYmRpYmxmZOhsZEKAEAFJ8lGQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Radiographic flat panel detector</title><source>esp@cenet</source><creator>TOMISAKI TAKAYUKI ; SAKAGUCHI TAKUYA</creator><creatorcontrib>TOMISAKI TAKAYUKI ; SAKAGUCHI TAKUYA</creatorcontrib><description>A glass substrate has formed on a front side thereof pixels each including a photoelectric conversion device, a capacitor and a TFT, and signal lines for reading signals via TFT's of the pixels, and on a back side thereof vertical selection lines for selecting the pixels, and has provided therethrough electric contacts for interconnection between gates of the TFT's and the vertical selection lines. The signal lines and the vertical selection lines are in a crossing relationship at thickness distance across the substrate, with reduced wiring capacities therebetween.</description><edition>7</edition><language>eng</language><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20020806&amp;DB=EPODOC&amp;CC=US&amp;NR=6429436B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20020806&amp;DB=EPODOC&amp;CC=US&amp;NR=6429436B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TOMISAKI TAKAYUKI</creatorcontrib><creatorcontrib>SAKAGUCHI TAKUYA</creatorcontrib><title>Radiographic flat panel detector</title><description>A glass substrate has formed on a front side thereof pixels each including a photoelectric conversion device, a capacitor and a TFT, and signal lines for reading signals via TFT's of the pixels, and on a back side thereof vertical selection lines for selecting the pixels, and has provided therethrough electric contacts for interconnection between gates of the TFT's and the vertical selection lines. The signal lines and the vertical selection lines are in a crossing relationship at thickness distance across the substrate, with reduced wiring capacities therebetween.</description><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAISkzJzE8vSizIyExWSMtJLFEoSMxLzVFISS1JTS7JL-JhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGhwWYmRpYmxmZOhsZEKAEAFJ8lGQ</recordid><startdate>20020806</startdate><enddate>20020806</enddate><creator>TOMISAKI TAKAYUKI</creator><creator>SAKAGUCHI TAKUYA</creator><scope>EVB</scope></search><sort><creationdate>20020806</creationdate><title>Radiographic flat panel detector</title><author>TOMISAKI TAKAYUKI ; SAKAGUCHI TAKUYA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6429436B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2002</creationdate><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TOMISAKI TAKAYUKI</creatorcontrib><creatorcontrib>SAKAGUCHI TAKUYA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TOMISAKI TAKAYUKI</au><au>SAKAGUCHI TAKUYA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Radiographic flat panel detector</title><date>2002-08-06</date><risdate>2002</risdate><abstract>A glass substrate has formed on a front side thereof pixels each including a photoelectric conversion device, a capacitor and a TFT, and signal lines for reading signals via TFT's of the pixels, and on a back side thereof vertical selection lines for selecting the pixels, and has provided therethrough electric contacts for interconnection between gates of the TFT's and the vertical selection lines. The signal lines and the vertical selection lines are in a crossing relationship at thickness distance across the substrate, with reduced wiring capacities therebetween.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
title Radiographic flat panel detector
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T22%3A38%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TOMISAKI%20TAKAYUKI&rft.date=2002-08-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS6429436B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true