Semiconductor device capable of preventing disconnection in a through hole

A through hole passes through an interlayer isolation film and an antireflection film, to partially expose a surface of a first wiring layer. A clearance filling member fills up a clearance under an inner edge of the antireflection film. A barrier metal film continuously covers the exposed surface o...

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Bibliographische Detailangaben
Hauptverfasser: HAGI KIMIO, OOKUMA YUUKO
Format: Patent
Sprache:eng
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