Etch method using a dielectric etch chamber with expanded process window
A method for etching a dielectric in a thermally controlled plasma etch chamber with an expanded processing window. The method is adapted to incorporate benefits of a the thermal control and high evacuation capability of the chamber. Etchent gases include hydrocarbons, oxygen and inert gas. Explanat...
Gespeichert in:
Hauptverfasser: | , , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | DOAN KENNY L SHAN HONGCHING PU BRYAN Y CHANG MELODY KIM YUNSANG WANG JUDY BJORKMAN CLAES LIU JINGBAO KOMATSU TAKEHIKO WANG RUIPING |
description | A method for etching a dielectric in a thermally controlled plasma etch chamber with an expanded processing window. The method is adapted to incorporate benefits of a the thermal control and high evacuation capability of the chamber. Etchent gases include hydrocarbons, oxygen and inert gas. Explanation is provided for enablling the use of hexafluoro-1,3-butadiene in a capacitively coupled etch plasma. The method is very useful for creating via, self aligned contacts, dual damascene, and other dielectric etch. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6403491B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6403491B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6403491B13</originalsourceid><addsrcrecordid>eNqNisEKwjAQBXPxIOo_7A8IlhbBq6XSu3ou6-7TBNokJJH6-Sr4AZ4GZmZp-q6IpQnFBqVndv5BTOowQkpyQvhmsTzdkGh2xRJekb1CKaYgyPljvYZ5bRZ3HjM2P64MnbpL228Rw4AcWeBRhut53-zq5lAdq_qP5Q0jGTPr</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Etch method using a dielectric etch chamber with expanded process window</title><source>esp@cenet</source><creator>DOAN KENNY L ; SHAN HONGCHING ; PU BRYAN Y ; CHANG MELODY ; KIM YUNSANG ; WANG JUDY ; BJORKMAN CLAES ; LIU JINGBAO ; KOMATSU TAKEHIKO ; WANG RUIPING</creator><creatorcontrib>DOAN KENNY L ; SHAN HONGCHING ; PU BRYAN Y ; CHANG MELODY ; KIM YUNSANG ; WANG JUDY ; BJORKMAN CLAES ; LIU JINGBAO ; KOMATSU TAKEHIKO ; WANG RUIPING</creatorcontrib><description>A method for etching a dielectric in a thermally controlled plasma etch chamber with an expanded processing window. The method is adapted to incorporate benefits of a the thermal control and high evacuation capability of the chamber. Etchent gases include hydrocarbons, oxygen and inert gas. Explanation is provided for enablling the use of hexafluoro-1,3-butadiene in a capacitively coupled etch plasma. The method is very useful for creating via, self aligned contacts, dual damascene, and other dielectric etch.</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20020611&DB=EPODOC&CC=US&NR=6403491B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20020611&DB=EPODOC&CC=US&NR=6403491B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DOAN KENNY L</creatorcontrib><creatorcontrib>SHAN HONGCHING</creatorcontrib><creatorcontrib>PU BRYAN Y</creatorcontrib><creatorcontrib>CHANG MELODY</creatorcontrib><creatorcontrib>KIM YUNSANG</creatorcontrib><creatorcontrib>WANG JUDY</creatorcontrib><creatorcontrib>BJORKMAN CLAES</creatorcontrib><creatorcontrib>LIU JINGBAO</creatorcontrib><creatorcontrib>KOMATSU TAKEHIKO</creatorcontrib><creatorcontrib>WANG RUIPING</creatorcontrib><title>Etch method using a dielectric etch chamber with expanded process window</title><description>A method for etching a dielectric in a thermally controlled plasma etch chamber with an expanded processing window. The method is adapted to incorporate benefits of a the thermal control and high evacuation capability of the chamber. Etchent gases include hydrocarbons, oxygen and inert gas. Explanation is provided for enablling the use of hexafluoro-1,3-butadiene in a capacitively coupled etch plasma. The method is very useful for creating via, self aligned contacts, dual damascene, and other dielectric etch.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNisEKwjAQBXPxIOo_7A8IlhbBq6XSu3ou6-7TBNokJJH6-Sr4AZ4GZmZp-q6IpQnFBqVndv5BTOowQkpyQvhmsTzdkGh2xRJekb1CKaYgyPljvYZ5bRZ3HjM2P64MnbpL228Rw4AcWeBRhut53-zq5lAdq_qP5Q0jGTPr</recordid><startdate>20020611</startdate><enddate>20020611</enddate><creator>DOAN KENNY L</creator><creator>SHAN HONGCHING</creator><creator>PU BRYAN Y</creator><creator>CHANG MELODY</creator><creator>KIM YUNSANG</creator><creator>WANG JUDY</creator><creator>BJORKMAN CLAES</creator><creator>LIU JINGBAO</creator><creator>KOMATSU TAKEHIKO</creator><creator>WANG RUIPING</creator><scope>EVB</scope></search><sort><creationdate>20020611</creationdate><title>Etch method using a dielectric etch chamber with expanded process window</title><author>DOAN KENNY L ; SHAN HONGCHING ; PU BRYAN Y ; CHANG MELODY ; KIM YUNSANG ; WANG JUDY ; BJORKMAN CLAES ; LIU JINGBAO ; KOMATSU TAKEHIKO ; WANG RUIPING</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6403491B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2002</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>DOAN KENNY L</creatorcontrib><creatorcontrib>SHAN HONGCHING</creatorcontrib><creatorcontrib>PU BRYAN Y</creatorcontrib><creatorcontrib>CHANG MELODY</creatorcontrib><creatorcontrib>KIM YUNSANG</creatorcontrib><creatorcontrib>WANG JUDY</creatorcontrib><creatorcontrib>BJORKMAN CLAES</creatorcontrib><creatorcontrib>LIU JINGBAO</creatorcontrib><creatorcontrib>KOMATSU TAKEHIKO</creatorcontrib><creatorcontrib>WANG RUIPING</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DOAN KENNY L</au><au>SHAN HONGCHING</au><au>PU BRYAN Y</au><au>CHANG MELODY</au><au>KIM YUNSANG</au><au>WANG JUDY</au><au>BJORKMAN CLAES</au><au>LIU JINGBAO</au><au>KOMATSU TAKEHIKO</au><au>WANG RUIPING</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Etch method using a dielectric etch chamber with expanded process window</title><date>2002-06-11</date><risdate>2002</risdate><abstract>A method for etching a dielectric in a thermally controlled plasma etch chamber with an expanded processing window. The method is adapted to incorporate benefits of a the thermal control and high evacuation capability of the chamber. Etchent gases include hydrocarbons, oxygen and inert gas. Explanation is provided for enablling the use of hexafluoro-1,3-butadiene in a capacitively coupled etch plasma. The method is very useful for creating via, self aligned contacts, dual damascene, and other dielectric etch.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US6403491B1 |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Etch method using a dielectric etch chamber with expanded process window |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T19%3A55%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DOAN%20KENNY%20L&rft.date=2002-06-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS6403491B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |