Thermal modulation system and method for locating a circuit defect

A system and method for locating a circuit defect, such as a short or an incipient open, in an electric circuit in a workpiece, such a Printed Circuit Board (PCB) or MultiChip Module (MCM). The circuit is connected to a device for sensitively measuring any resistance change. A thermal stimulus is ap...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HALPERIN ARNOLD, SCAMAN MICHAEL E, GUIDOTTI DANIEL, ZINGHER ARTHUR R
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!