Electrophotographic photoconductor
A photoconductor includes a conductive substrate, an undercoat layer on the substrate, and at least one photosensitive layer on the undercoat layer. The radius of vacancy type defects in each of the photosensitive layer and in the undercoat layer is o.4 nm or less. In one embodiment, the radius of v...
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| creator | NABETA OSAMU YAMAZAKI MIKIO |
| description | A photoconductor includes a conductive substrate, an undercoat layer on the substrate, and at least one photosensitive layer on the undercoat layer. The radius of vacancy type defects in each of the photosensitive layer and in the undercoat layer is o.4 nm or less. In one embodiment, the radius of vacancy type defects is measured by a positron annihilation method. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6300026B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6300026B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6300026B13</originalsourceid><addsrcrecordid>eNrjZFByzUlNLinKL8jIL8lPL0osyMhMVgBzkvPzUkqTS_KLeBhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwmbGBgYGRmZOhMRFKAM3OJqw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Electrophotographic photoconductor</title><source>esp@cenet</source><creator>NABETA OSAMU ; YAMAZAKI MIKIO</creator><creatorcontrib>NABETA OSAMU ; YAMAZAKI MIKIO</creatorcontrib><description>A photoconductor includes a conductive substrate, an undercoat layer on the substrate, and at least one photosensitive layer on the undercoat layer. The radius of vacancy type defects in each of the photosensitive layer and in the undercoat layer is o.4 nm or less. In one embodiment, the radius of vacancy type defects is measured by a positron annihilation method.</description><edition>7</edition><language>eng</language><subject>CINEMATOGRAPHY ; ELECTROGRAPHY ; ELECTROPHOTOGRAPHY ; HOLOGRAPHY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MAGNETOGRAPHY ; MEASURING ; PHOTOGRAPHY ; PHYSICS ; TESTING</subject><creationdate>2001</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20011009&DB=EPODOC&CC=US&NR=6300026B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20011009&DB=EPODOC&CC=US&NR=6300026B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NABETA OSAMU</creatorcontrib><creatorcontrib>YAMAZAKI MIKIO</creatorcontrib><title>Electrophotographic photoconductor</title><description>A photoconductor includes a conductive substrate, an undercoat layer on the substrate, and at least one photosensitive layer on the undercoat layer. The radius of vacancy type defects in each of the photosensitive layer and in the undercoat layer is o.4 nm or less. In one embodiment, the radius of vacancy type defects is measured by a positron annihilation method.</description><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>ELECTROPHOTOGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MAGNETOGRAPHY</subject><subject>MEASURING</subject><subject>PHOTOGRAPHY</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2001</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFByzUlNLinKL8jIL8lPL0osyMhMVgBzkvPzUkqTS_KLeBhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfGiwmbGBgYGRmZOhMRFKAM3OJqw</recordid><startdate>20011009</startdate><enddate>20011009</enddate><creator>NABETA OSAMU</creator><creator>YAMAZAKI MIKIO</creator><scope>EVB</scope></search><sort><creationdate>20011009</creationdate><title>Electrophotographic photoconductor</title><author>NABETA OSAMU ; YAMAZAKI MIKIO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6300026B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2001</creationdate><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>ELECTROPHOTOGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MAGNETOGRAPHY</topic><topic>MEASURING</topic><topic>PHOTOGRAPHY</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NABETA OSAMU</creatorcontrib><creatorcontrib>YAMAZAKI MIKIO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NABETA OSAMU</au><au>YAMAZAKI MIKIO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Electrophotographic photoconductor</title><date>2001-10-09</date><risdate>2001</risdate><abstract>A photoconductor includes a conductive substrate, an undercoat layer on the substrate, and at least one photosensitive layer on the undercoat layer. The radius of vacancy type defects in each of the photosensitive layer and in the undercoat layer is o.4 nm or less. In one embodiment, the radius of vacancy type defects is measured by a positron annihilation method.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | CINEMATOGRAPHY ELECTROGRAPHY ELECTROPHOTOGRAPHY HOLOGRAPHY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MAGNETOGRAPHY MEASURING PHOTOGRAPHY PHYSICS TESTING |
| title | Electrophotographic photoconductor |
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