Length measuring instrument, and machine having a length measuring instrument
A length measuring instrument having a scale which can be scanned by a scanner device is provided. The scale is rotatably supported in an end region about the measurement axis X by a pivot bearing. The scanner device is guided on the scale so that rotations of the scanner device are transmitted to t...
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creator | FALKINGER BERNHARD TONDORF SEBASTIAN |
description | A length measuring instrument having a scale which can be scanned by a scanner device is provided. The scale is rotatably supported in an end region about the measurement axis X by a pivot bearing. The scanner device is guided on the scale so that rotations of the scanner device are transmitted to the scale. A length measuring instrument of this can be used especially advantageously in telescoping arms of a hexapod machine. |
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The scale is rotatably supported in an end region about the measurement axis X by a pivot bearing. The scanner device is guided on the scale so that rotations of the scanner device are transmitted to the scale. A length measuring instrument of this can be used especially advantageously in telescoping arms of a hexapod machine.</description><edition>7</edition><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2001</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20010814&DB=EPODOC&CC=US&NR=6272766B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20010814&DB=EPODOC&CC=US&NR=6272766B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>FALKINGER BERNHARD</creatorcontrib><creatorcontrib>TONDORF SEBASTIAN</creatorcontrib><title>Length measuring instrument, and machine having a length measuring instrument</title><description>A length measuring instrument having a scale which can be scanned by a scanner device is provided. The scale is rotatably supported in an end region about the measurement axis X by a pivot bearing. The scanner device is guided on the scale so that rotations of the scanner device are transmitted to the scale. A length measuring instrument of this can be used especially advantageously in telescoping arms of a hexapod machine.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2001</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPD1Sc1LL8lQyE1NLC4tysxLV8jMKy4pKs1NzSvRUUjMS1HITUzOyMxLVchILANJJyrk4NbBw8CalphTnMoLpbkZFNxcQ5w9dFML8uNTiwsSk1PzUkviQ4PNjMyNzM3MnAyNiVACAJ_xNmo</recordid><startdate>20010814</startdate><enddate>20010814</enddate><creator>FALKINGER BERNHARD</creator><creator>TONDORF SEBASTIAN</creator><scope>EVB</scope></search><sort><creationdate>20010814</creationdate><title>Length measuring instrument, and machine having a length measuring instrument</title><author>FALKINGER BERNHARD ; TONDORF SEBASTIAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6272766B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2001</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>FALKINGER BERNHARD</creatorcontrib><creatorcontrib>TONDORF SEBASTIAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FALKINGER BERNHARD</au><au>TONDORF SEBASTIAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Length measuring instrument, and machine having a length measuring instrument</title><date>2001-08-14</date><risdate>2001</risdate><abstract>A length measuring instrument having a scale which can be scanned by a scanner device is provided. The scale is rotatably supported in an end region about the measurement axis X by a pivot bearing. The scanner device is guided on the scale so that rotations of the scanner device are transmitted to the scale. A length measuring instrument of this can be used especially advantageously in telescoping arms of a hexapod machine.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
title | Length measuring instrument, and machine having a length measuring instrument |
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