Mechanical fixture for holding electronic devices under test showing adjustments in multiple degrees of freedom

A fixture to hold an electronic substrate having probe areas on a top surface. The top surface of the electronic substrate is left open to provide a maximum area to couple interconnect wires for a device under test. In addition, a bottom surface of the substrate is left open to provide a maximum are...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MARNELL MARK A, PORTER DONALD W, SCHMIDT ROGER R, BARRINGER DENNIS R, WHITE WADE H, LAFORCE MARK R
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!