System for designing and testing a sigma-delta modulator using response surface techniques

The present invention provides a method and apparatus which uses data containing non-linearity information regarding the integrator circuits used in over-sampled Analog-to-Digital Converters to predict the Signal-to-Distortion Ratio and the Signal-to-Noise Ratio. Input response data used to evaluate...

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1. Verfasser: MCGRATH DONALD THOMAS
Format: Patent
Sprache:eng
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