Method for electronically measuring size of internal void in electrically conductive lead
The size of an internal void in an electrically conductive lead is measured by determining its electrical resistance at a plurality of A.C. frequencies, ranging from D.C. to a frequency on the order of 50 to 100 GHz at which the majority of current flows along the skin of the lead. The test data is...
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| creator | JOO YOUNGANG YIU TSUI TING LIU YOW JUANG W SHABDE SUNIL N |
| description | The size of an internal void in an electrically conductive lead is measured by determining its electrical resistance at a plurality of A.C. frequencies, ranging from D.C. to a frequency on the order of 50 to 100 GHz at which the majority of current flows along the skin of the lead. The test data is compared with reference data for an electrically conductive reference lead having characteristics which are essentially similar to the test lead. The difference between the two sets of data increases with the size of an internal void in the test lead. The difference will be greatest at D.C. because the current will flow through substantially the entire cross-section of the lead and the cross-sectional area will be reduced by the internal void. The test data will approach the reference data as the frequency increases because the majority of the current will flow through the skin of the test lead and will be less affected by the internal void. The surface roughness of a lead caused by surface voids is measured by determining its electrical resistance at a frequency high enough that the majority of the current flows through the skin of the lead. The distance at which the surface current flows, and thereby the resistance of the lead, increase with the surface roughness. |
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The test data is compared with reference data for an electrically conductive reference lead having characteristics which are essentially similar to the test lead. The difference between the two sets of data increases with the size of an internal void in the test lead. The difference will be greatest at D.C. because the current will flow through substantially the entire cross-section of the lead and the cross-sectional area will be reduced by the internal void. The test data will approach the reference data as the frequency increases because the majority of the current will flow through the skin of the test lead and will be less affected by the internal void. The surface roughness of a lead caused by surface voids is measured by determining its electrical resistance at a frequency high enough that the majority of the current flows through the skin of the lead. 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The test data is compared with reference data for an electrically conductive reference lead having characteristics which are essentially similar to the test lead. The difference between the two sets of data increases with the size of an internal void in the test lead. The difference will be greatest at D.C. because the current will flow through substantially the entire cross-section of the lead and the cross-sectional area will be reduced by the internal void. The test data will approach the reference data as the frequency increases because the majority of the current will flow through the skin of the test lead and will be less affected by the internal void. The surface roughness of a lead caused by surface voids is measured by determining its electrical resistance at a frequency high enough that the majority of the current flows through the skin of the lead. 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The test data is compared with reference data for an electrically conductive reference lead having characteristics which are essentially similar to the test lead. The difference between the two sets of data increases with the size of an internal void in the test lead. The difference will be greatest at D.C. because the current will flow through substantially the entire cross-section of the lead and the cross-sectional area will be reduced by the internal void. The test data will approach the reference data as the frequency increases because the majority of the current will flow through the skin of the test lead and will be less affected by the internal void. The surface roughness of a lead caused by surface voids is measured by determining its electrical resistance at a frequency high enough that the majority of the current flows through the skin of the lead. The distance at which the surface current flows, and thereby the resistance of the lead, increase with the surface roughness.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | Method for electronically measuring size of internal void in electrically conductive lead |
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