Circuit and method for testing whether a programmable logic device complies with a zero-hold-time requirement

Described are a system and method for quickly and accurately testing sequential storage elements on programmable logic devices for zero-hold-time compliance. A programmable logic device is configured such that both the data and clock terminals of a selected sequential logic element connect to an inp...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	MATERA MICHAEL M
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!