System and method for optically locating microchannel positions

A system and method is disclosed for optically locating a microchannel position. A laser source generates a primary laser beam which is directed at a microchannel plate. The microchannel plates include microchannels at various locations. A back-reflectance beam detector receives a back-reflected bea...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	DAVIDSON J. COURTNEY, BREWER LAURENCE R, BALCH JOSEPH, KIMBROUGH JOSEPH
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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